Detail Cantuman Kembali
Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization V.2
V.2
620.115 HAI H V.2
978-981-4322-80-5
620.115
World Scientific Publishing Company
2011
Singapore ; Hackensack, NJ
xxiv, 610 hlm.: ill.; 24 cm.
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